VK-X Series 3D Laser Scanning Microscopes
| August 25th, 2011VK-X Series 3D Laser Scanning Microscopes
Non-contact Profile and Roughness Measurements on Nearly Any Material.
Combining the capabilities of an optical microscope, profilometer and SEM, the VK-X 3D Laser Scanning Microscopes are able to perform profile, roughness and thickness measurements with an industry-leading 0.5 nm Z-axis resolution. Dramatically reduce user error and analysis time using a new high-speed scan mode and one-touch automated operation – without the need for sample preparation
